Characterization of geological samples with combined microscopy imaging techniques
Comprehensive investigations of geological samples can be challenging due to variations in size, shape, structure and composition.
For that reason flexible analysis techniques are required which can be easily adapted to individual sample characteristics. The combination of large-area confocal Raman Imaging, Atomic Force Microscopy (AFM), and TrueSurface Microscopy fulfill these requirements and provide unique topographic as well as chemical information to characterize a sample three-dimensionally, underneath and at the surface in a non-destructive manner.
Geological sample analyzed with combined TrueSurface Microscopy and confocal Raman Imaging